QuantumATK Forum
QuantumATK => General Questions and Answers => Topic started by: 395235863 on December 12, 2015, 09:20
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Dear QuantumWise Staff :
1.How to use a doping concentration range in device's electrode to simulate the experimental FET metal-semiconductor Schottky barrier ?How to choose the value of doping concentration?
2.When i calculate device's Vgate-current curve, how do the dielectric thickness affect the current?Generally,in device simulation,should dielectric thickness be bigger than a critical value?
Thank you in advance.
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For both questions the answer is to test your set up according to your assumptions.
Here is a relevant tutorial: http://quantumwise.com/documents/tutorials/latest/InAsDevice/index.html/
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I have read the tutorial in detail before I post the question.
2.When i calculate device's Vgate-current curve, how do the dielectric thickness affect the current?Generally,in device simulation,should dielectric thickness be bigger than a critical value?
The second question I can test my set up.But how to deal with the first question?When i choose different value of doping concentration,what should i calculate to compare with metal-semiconductor?For example,can i get p-i junction's barrier as well as Schottky barrier?Like the attached png,what region's gap is the same to contact's barrier?
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need your help Thank you!
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I don't understand this question. Are you in doubt about the value of a suitable doping concentration, or is the question about how to use a specific doping in ATK?
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I don't understand this question. Are you in doubt about the value of a suitable doping concentration, or is the question about how to use a specific doping in ATK?
I want to know how to choose a suitable doping concentration.
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If you want to compare theoretical results to experimental results for some specific FET I guess you need to consult the literature to figure out what the expected doping level is. There really is no general answer to such question.
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You might find this link useful http://arxiv.org/pdf/1512.03534v2.pdf