Hi,
I am trying to simulate the interfacial thermal resistance at Si-Ge interfaces, and was following the tutorial on the Si(100) and Si(110) interface using MD. I have attached a file describing the geometry I am currently looking at. From the NPT stabilization of this and similar other previous simulations, it seems to me that the structure is not fully relaxed. In the NPT simulation, there appears to be large destabilizing force at the beginning, which results in weird situations like a wavy character throughout the Si-Ge-Si structure, premature melting at localized regions, etc. In this simulation I set the maximum number of steps in Geometry Optimization as 100000 (maximum possible in VNL), but it ran for 14 fs, and went onto the NPT step. Could you please help me setup the proper relaxation method for this kind of interface? Is there a suitable tutorial or other resource that you can possibly point me to, so that I can get a better hold on the geometry optimization methods? Thanks a lot, I really appreciate your help.
Regards,
Debarghya